Sci检索期刊论文
[1]Song Jianjun, Zhang Heming, Hu Huiyong, Dai Xianying, and Xuan Rongxi, Determination of conduction band edge characteristics of strained Si/Si1-xGex, Chinese Physics,2007 16(12): 3827-3831
[2]宋建军、张鹤鸣、戴显英、胡辉勇、宣荣喜,第一性原理研究应变Si/(111)Si1-xGex能带结构,物理学报,2008 57(9): 5918-5922
[3]宋建军、张鹤鸣、戴显英、胡辉勇、宣荣喜,应变Si价带色散关系模型,物理学报,2008 57(11): 7228-7232
[4]Song JianJun,Zhang HeMing,Hu HuiYong,Fu Qiang,Calculation of band structure in (101)-biaxially strained Si,Science In China,2009 52(4): 546-550
[5]宋建军,张鹤鸣,胡辉勇,宣荣喜,戴显英,应变Si1-xGex能带结构研究,物理学报,2009 58(11): 7947-7951
[6]宋建军,张鹤鸣,宣荣喜,胡辉勇,戴显英,应变Si/(001)Si1-xGex空穴有效质量各向异性,物理学报,2009 58(7):4958-4961
[7]宋建军,张鹤鸣,胡辉勇,宣荣喜,戴显英,应变Si1-xGex/(111)Si空穴有效质量模型,物理学报,2010 59(1): 579-582
[8]宋建军,张鹤鸣,胡辉勇,戴显英,宣荣喜,应变Si/(001)Si1-xGex本征载流子浓度模型,物理学报,2010 59(3): 2064~2067
[9]Song JianJun,Zhang HeMing,Hu HuiYong,Dai XianYing, Xuan Rongxi, Valence band structure of strained Si/(111)Si1-xGex, Science In China, 2010 53(3): 454~457
[10]宋建军,张鹤鸣,戴显英,宣荣喜,胡辉勇,不同晶系应变Si状态密度研究,物理学报,2011 60(4): 047106
[11]宋建军,张鹤鸣,胡辉勇,王晓艳,王冠宇,四方晶系应变Si空穴散射机制,物理学报,2012 61(5): 057304
[12]SONG JianJun, ZHANG HeMing, HU HuiYong, WANG XiaoYan & WANG GuanYu, Hole Mobility Enhancement of Si by Rhombohedral Strain, Science in China, Physics Mechanics and Astronomy, 2012 55(8):1399-1403
[13]SONG JianJun, YANG Chao, ZHANG HeMing, HU HuiYong, ZHOU CHunYu & WANG Bin, Longitudinal, Transverse, Density-of-States, and Conductivity Masses of Electron in (001), (101) and (111) Biaxially-Strained-Si and Strained-Si1-xGex, Science in China, Physics Mechanics and Astronomy, 2012 55(11):2033-2037
[14]Song Jian-Jun, Yang Chao, Wang Guan-Yu, Zhou Chun-Yu, Wang Bin, Hu Hui-Yong, and Zhang He-Ming,Conduction Band Model of [110]/(001) Uniaxially Strained Si,Japanese Journal of Applied Physics, 2012 51(10):104301
[15]Song Jian-Jun, Yang Chao, Hu Hui-Yong, Dai Xian-Ying, Wang Cheng and Zhang He-Ming,Penetration Depth at Various Raman Excitation Wavelengths and Stress Model for Raman Spectrum in Biaxially-Strained Si, Science in China, Physics Mechanics and Astronomy, 2013 56(11): 1–6
[16]宋建军,杨超,朱贺,张鹤鸣,宣荣喜,胡辉勇,舒斌,SOI SiGe HBT结构设计及频率特性研究,物理学报
Ei检索期刊论文
[1]宋建军,张鹤鸣,舒斌,胡辉勇,戴显英,K.P dispersion relation near Δi valley in Strained Si1-xGex/Si,半导体学报,2008 29(3) 442-446
[2]Song Jianjun, Zhang Heming, Hu Huiyong, Dai XianYing, Xuan Rongxi, Chinese Journal of Semiconductors, Calculation of band edge levels of strained Si/(111)Si1-xGex, 2010 31(1): 012001-3
[3]Song Jianjun,Zhang Heming, Dai Xianying, Hu Huiyong and Xuan Rongxi, Chinese Journal of Semiconductors, Band edge model of (101)-biaxial strained Si, 2008 29(9): 1670-1673
[4]Song Jianjun,zhu He,Zhang Heming, Dai Xianying, Hu Huiyong and Xuan Rongxi,Model of Averaged Hole Mobility of Biaxially Strained Si, Journal of semiconductor, 2013 34(8): 1-4
ISTP检索会议论文
[1]JianJun Song, HeMing Zhang, HuiYong Hu, XianYing Dai, RongXi Xuan, Study on Hole Effective Mass of Strained Si1-xGex/(101)Si,IEEE International Conference on Electron Devices and Solid-State Circuits, 2009, Xi’an
[2]Jian-Jun Song, He-Ming Zhang, Hui-Yong Hu, Xian-Ying Dai, Rong-Xi Xuan, Intrinsic carrier concentration in strained Si1-xGex/(101)Si, Materials Science Forum 2011 663-665: 470-472
[3]Jian-Jun Song, Heng-Sheng Shan, He-Ming Zhang, Hui-Yong Hu, Xian-Ying Dai, Rong-Xi Xuan, Model of DOS near the Top of Valence Band in Strained Si1-xGex/(001)Si, Applied Mechanics and Materials, 2011 55-57: 979-982
[4]JianJun Song,Sun Liu, HeMing Zhang, Design and implementation of High-Speed Dual-Modulus, Applied Mechanics and Materials 2012 109: 271-275
[5]Jian-Jun Song, Hua-Ying Wu, He-Ming Zhang, Model of electron scattering of strained Si/Si1-xGex(100), Applied Mechanics and Materials 2012 110-116 3338-3342
[6]ian-jun Song,Shuai Lei, He-ming Zhang, Anisotropic Hole Mobility in Strained Si1-xGex/(001)Si, Solid State Phenomena 2012 181-182: 388-392
专利
[1]宋建军、王冠宇、张鹤鸣、胡辉勇、宣荣喜、周春宇。异质金属堆叠栅SSGOI pMOSFET器件结构(ZL2013021600354890,授权时间:2013年2月)
[2]宋建军、王冠宇、张鹤鸣、胡辉勇、宣荣喜。多晶Si1-xGex/金属并列覆盖双栅SSGOI nMOSFET器件结构(ZL2012121300772960,授权时间:2013年1月)
[3]宋建军、王冠宇、张鹤鸣、胡辉勇、宣荣喜、周春宇。一种垂直交叉堆叠栅应变SiGeC量子阱沟道CMOS器件结构(ZL2013011500354830,授权时间:2013年2月)