1.             游海龙, et al., BOX-COX变换与微电路工艺设备表征.固体电子学研究与进展, 2005(03): p. 398-402

2.             游海龙, et al., 利用试验设计方法表征微电路工艺设备.微电子学, 2005(04): p. 382-385

3.             游海龙, 贾新章, and 张春福, 基于广义回归神经网络的微电路工艺设备表征.西安电子科技大学学报, 2005(06): p. 911-914

4.             游海龙, et al., Kriging插值与拉丁超立方试验相结合构造电路元模型.系统仿真学报, 2005(11).

5.             游海龙, 张小波, and 贾新章, 基于试验设计技术的IC优化设计.电子器件, 2005(04): p. 830-833

6.             张春福, et al., 界面电偶极子对GaN/AlGaN/GaN光电探测器紫外/太阳光选择比的影响.物理学报, 2005(08): p. 3810-3814.

7.             You, H., X. Jia, and S. Wang. The Characterization and Optimization of the Thermal Oxidation Process Equipment Using Experimental Design and Data Transformation. in Microelectronics, 2006 25th International Conference on. 2006.

8.             游海龙, et al., 试验设计与仿真相结合构造集成电路元模型的方法研究.电子学报, 2006(06): p. 1159-1162.

9.             You, H.L. and X.Z. Jia, The characterization and optimization of the microcircuit process equipment using design of experimentand data transformation. Chinese Journal of Electronics, 2007. 16(1): p. 69-72.

10.          游海龙and 贾新章, 基于遗传算法的Kriging模型构造与优化.计算机辅助设计与图形学学报, 2007(01): p. 64-68

11.          游海龙, 贾新章, and 王少熙, 基于遗传算法的Kriging元模型及其在模拟集成电路优化设计中的应用.半导体学报, 2007(08): p. 1325-1329

12.          Maofeng, Y., et al. An Effective Method to Extract Probability Distribution of Circuit Performance Modeled by Quadratic Response Surface Model. in Information Science and Engineering, 2008. ISISE '08. International Symposium on. 2008.

13.          Hailong, Y., et al. Kriging Model combined with latin hypercube sampling for surrogate modeling of analog integrated circuit performance. in Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design. 2009.

14.          Jiwei, S., et al. Research on modeling control module of DC-DC converter for Simulink. in Power Electronics and Intelligent Transportation System (PEITS), 2009 2nd International Conference on. 2009.

15.          Jiwei, S., et al. Co-extraction method for DC model parameters of BJT based on global optimization and physical analysis. in Electron Devices and Solid-State Circuits, 2009. EDSSC 2009. IEEE International Conference of. 2009.

16.          Wang, H., H. You, and X. Jia. Analysis on the effect of regression and correlation models on the accuracy of Kriging model for IC. in Electron Devices and Solid-State Circuits, 2009. EDSSC 2009. IEEE International Conference of. 2009.

17.          You, H.L. and C.F. Zhang, Effects of optical interference and annealing on the performance of poly (3-hexylthiophene): fullerene based solar cells. Chinese Physics B, 2009. 18(5): p. 2096-2100.

18.          You, H.L. and C.F. Zhang, Influence of optical interference and carrier lifetime on the short circuit current density of organic bulk heterojunction solar cells. Chinese Physics B, 2009. 18(1): p. 349-356.

19.          游海龙and 贾新章, 采用响应曲面方法实现IC的稳健优化设计.西安电子科技大学学报, 2009(03): p. 458-462.

20.          游海龙, et al., 利用分步试验设计表征/优化工艺空间均匀性.微电子学, 2009(02): p. 285-288

21.          Hailong, Y., et al. Experimental research on the damage effect of HPM on semiconductor bipolar transistor. in Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on. 2010.